论文标题
长期增强的悖论结果由基于电压的可塑性规则解释
Paradoxical Results of Long-Term Potentiation explained by Voltage-based Plasticity Rule
论文作者
论文摘要
实验表明,在近端突触中导致长期增强的相同刺激模式将导致远端抑郁症。为了理解这些和其他令人惊讶的观察,我们在突触位置使用了Hebbian可塑性的现象学模型。我们的计算模型将紧凑形式的前和突触后神经元关节活性的HEBBIAN条件描述为谷氨酸痕迹的相互作用,该谷氨酸痕迹与突触前尖峰与突触后电压的时间过程相互作用。我们使用海马和新皮层中实验记录的树突电压痕迹测试模型。我们发现,刺激突触附近的电压的时间过程是可靠的预测指标,即刺激的突触是进行增强,抑郁还是没有变化。我们的模型可以解释不同的 - 乍一看似乎是悖论的 - 突触增强和抑郁实验的结果,具体取决于突触的树突位置以及刺激的频率或时间。
Experiments have shown that the same stimulation pattern that causes Long-Term Potentiation in proximal synapses, will induce Long-Term Depression in distal ones. In order to understand these, and other, surprising observations we use a phenomenological model of Hebbian plasticity at the location of the synapse. Our computational model describes the Hebbian condition of joint activity of pre- and post-synaptic neuron in a compact form as the interaction of the glutamate trace left by a presynaptic spike with the time course of the postsynaptic voltage. We test the model using experimentally recorded dendritic voltage traces in hippocampus and neocortex. We find that the time course of the voltage in the neighborhood of a stimulated synapse is a reliable predictor of whether a stimulated synapse undergoes potentiation, depression, or no change. Our model can explain the existence of different -- at first glance seemingly paradoxical -- outcomes of synaptic potentiation and depression experiments depending on the dendritic location of the synapse and the frequency or timing of the stimulation.