学术文献库

Spectral measurements of boundary localized in-gap modes are commonly used to identify topological insulators via the bulk-boundary correspondence. This can be extended to high-order topological insulators for which the most striking feature is in-gap modes at boundaries of higher co-dimension, e.g. the corners of a 2D material. Unfortunately, this spectroscopic approach is not always viable since the energies of the topological modes are not protected and they can often overlap the bulk bands, leading to potential misidentification. Since the topology of a material is a collective product of all its eigenmodes, any conclusive indicator of topology must instead be a feature of its bulk band structure, and should not rely on specific eigen-energies. For many topological crystalline insulators the key topological feature is fractional charge density arising from the filled bulk bands, but measurements of charge distributions have not been accessible to date. In this work, we experimentally measure boundary-localized fractional charge density of two distinct 2D rotationally-symmetric metamaterials, finding 1/4 and 1/3 fractionalization. We then introduce a new topological indicator based on collective phenomenology that allows unambiguous identification of higher-order topology, even in the absence of in-gap states. Finally, we demonstrate the higher-order bulk-boundary correspondence associated with this fractional feature by using boundary deformations to spectrally isolate localized corner modes where they were previously unobservable.