论文标题
从一个利用来定位补丁点
Localizing Patch Points From One Exploit
论文作者
论文摘要
披露漏洞后，自动补丁可以显着减少暴露窗口。为了实现这一目标，一个长期存在的问题是贴片本地化：找到一个可以合成补丁的程序点。我们提出PatchLoc，这是第一个自动识别弱势二进制中的位置的系统之一，只有一个漏洞，具有很高的精度。 PatchLoc对源代码，测试套件的可用性或专业知识没有任何假设。 PatchLoc查明点在大型现实世界应用中的有效贴片位置，其精度高度高，约有88％的43个CVE。这些结果源于一种新的方法，可以自动合成测试套件，该方法可以使概率排名并有效地区分候选程序贴片位置。
Automatic patch generation can significantly reduce the window of exposure after a vulnerability is disclosed. Towards this goal, a long-standing problem has been that of patch localization: to find a program point at which a patch can be synthesized. We present PatchLoc, one of the first systems which automatically identifies such a location in a vulnerable binary, given just one exploit, with high accuracy. PatchLoc does not make any assumptions about the availability of source code, test suites, or specialized knowledge of the vulnerability. PatchLoc pinpoints valid patch locations in large real-world applications with high accuracy for about 88% of 43 CVEs we study. These results stem from a novel approach to automatically synthesizing a test-suite which enables probabilistically ranking and effectively differentiating between candidate program patch locations.
