论文标题
扫描探针显微镜的晶体学图像处理的进步
Advances in Crystallographic Image Processing for Scanning Probe Microscopy
论文作者
论文摘要
本书章节回顾了自2010年本书系列中首次将对技术的描述首次公开访问以来，扫描探针显微镜（SPM）的晶体图像处理（CIP）的进展。在2010年的本书系列中，噪声比在各种或多或少的常规2D周期阵列的实验图中都显着增强了CIP和该技术的录制设备。在SPM成像环境中，CIP可以理解为通过计算方法对有效的实验扫描探针尖端的后验锐化。现在可以从2D周期性物理对象的图像中删除图像中的多个扫描探针效果，这些物理对象是自组装或人为创建的。现在在科学界接受的是，SPM尖端可以在显微镜操作过程中改变其形状和精细结构，从而以系统的方式使记录的图像混淆。 CIP恢复了此类图像中的许多污迹。从机器人和计算机愿景社区的几何Akaike信息标准的适应到对2D翻译对称性的明确检测使我们最近的许多进步。在本书的主体中，我们讨论了这种适应性，并在一个例子中简要说明了其实用性。
This book chapter reviews progress in crystallographic image processing (CIP) for scanning probe microscopy (SPM) that has occurred since our description of the technique was first put into open access in this book series in the year 2010. The signal to noise ratio in all kinds of experimental images of more or less regular 2D periodic arrays is significantly enhanced by CIP and the technique is independent of the type of recording device. In the SPM imaging context, CIP can be understood as an a posteriori sharpening of the effective experimental scanning probe tip by computational means. It is now possible to remove multiple scanning probe mini-tip effects in images from 2D periodic arrays of physical objects that either self-assembled or were created artificially. Accepted within the scientific community is by now also the fact that SPM tips can change their shape and fine structure during the operation of a microscope and, thereby, obfuscate the recorded images in systematic ways. CIP restores much of the smeared out information in such images. The adaptation of a geometric Akaike Information Criterion from the robotics and computer vision community to the unambiguous detection of 2D translation symmetries enabled much of our recent progress. In the main body of this book chapter, we discuss this adaptation and briefly illustrate its utility on an example.
