论文标题

设计受量规依赖对称指标保护的拓扑缺陷线

Designing Topological Defect Lines Protected by Gauge-dependent Symmetry Indicators

论文作者

Wen, Erda, Bisharat, Dia'aaldin J., Davis, Robert J., Yang, Xiaozhen, Sievenpiper, Daniel F.

论文摘要

对称指标是一种现代工具,用于表征仅需要最小计算费用但提供设计实用设备的优雅手段的拓扑阶段。本文演示了如何使用旋转对称指标来构建和表征拓扑具有稳健的波导,然后在印刷电路板(PCB)平台上对其进行实验验证。该设计利用了对称指标的真实空间量规依赖性,并采用了简单偏移的$ C_6 $晶格,形成了支持拓扑边缘模式的缺陷线。结果表明,模式可以实现与以前的拓扑波导相同的特征,但此外,还具有更大程度的重构性和形成单向终止的独特能力。此外,该设计说明了实际空间信息在确定光子晶体的拓扑特性中所扮演的关键作用,从而实现了更广泛的可能实现。

Symmetry indicators are a modern tool for characterizing topological phases that require only minimal computational expense but provide an elegant means of designing practical devices. This paper demonstrates how a rotational symmetry indicator can be used to construct and characterize a topologically robust waveguide, which is then verified experimentally on a printed circuit board (PCB) platform. The design takes advantage of the real-space gauge-dependency of the symmetry indicators and adopts a $C_6$ lattice with simple shifts, forming a defect line supporting topological edge modes. It is shown that the modes can realize the same features as previous topological waveguides, but in addition possesses a greater degree of reconfigurability and the unique ability to form a one-way termination. Moreover, the design illustrates the critical role real space information plays in determining the topological properties of photonic crystals, enabling a wider range of possible realizations.

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