论文标题
中子照射下的Xilinx深度学习处理单元的评估
Evaluation of Xilinx Deep Learning Processing Unit under Neutron Irradiation
论文作者
论文摘要
本文研究了中子照射下Xilinx深学习加工单元（DPU）的可靠性。它分析了单个事件效应（SEE）对在Xilinx Ultrascale+ MPSOC上运行RESNET50模型的DPU准确性的影响。
This paper studies the dependability of the Xilinx Deep-Learning Processing Unit (DPU) under neutron irradiation. It analyses the impact of Single Event Effects (SEEs) on the accuracy of the DPU running the resnet50 model on a Xilinx Ultrascale+ MPSoC.
